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VL Plan Fluor EPI Brightfield Observation Objective Lens

Part Number: VL Plan Fluor EPI 50X

Near-diffraction-limited resolution (NA=0.8 support), flat-field correction ensures the entire 1mm field of view (FN25÷50×) is clear, and colors accurately reproduce microstructures.


Applications:
Metallographic structure analysis (distinction between martensite/austenite), nanoscale defect localization on wafers.

Caution
  • Product image is for representative purposes only and not reflective of every product available on this page.

Configured Specifications

NA0.8WD1mm
R0.34um±D.F0.43um
Unit Price
Total
Ship Date
TBD
Qty.
Quantity Price(USD)Ship Date
1-10TBD
10-TBD
NOTE : Ship Dates above are subject to change depending upon availability.

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